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1

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - VLSI testing based security metric for IC camouflaging

Rajendran, Jeyavijayan, Sinanoglu, Ozgur, Karri, Ramesh

Year:

2013

Language:

english

File:

PDF, 872 KB

english, 2013

2

Ultra-Low Power, Secure IoT Platform for Predicting Cardiovascular Diseases

Yasin, Muhammad, Tekeste, Temesghen, Saleh, Hani, Mohammad, Baker, Sinanoglu, Ozgur, Ismail, Mohammed

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2017

Language:

english

File:

PDF, 2.88 MB

english, 2017

3

[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - ATPG-based cost-effective, secure logic locking

Sengupta, Abhrajit, Nabeel, Mohammed, Yasin, Muhammad, Sinanoglu, Ozgur

Year:

2018

Language:

english

File:

PDF, 3.49 MB

english, 2018

4

Logic Locking with Provable Security Against Power Analysis Attacks

Sengupta, Abhrajit, Mazumdar, Bodhisatwa, Yasin, Muhammad, Sinanoglu, Ozgur

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2019

File:

PDF, 6 KB

2019

5

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Design and analysis of ring oscillator based Design-for-Trust technique

Rajendran, Jeyavijayan, Jyothi, Vinayaka, Sinanoglu, Ozgur, Karri, Ramesh

Year:

2011

Language:

english

File:

PDF, 1.94 MB

english, 2011

6

Novel Test-Mode-Only Scan Attack and Countermeasure for Compression-Based Scan Architectures

Ali, Sk Subidh, Saeed, Samah M., Sinanoglu, Ozgur, Karri, Ramesh

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 11.05 MB

english, 2015

7

[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - TMO: A new class of attack on cipher misusing test infrastructure

Ali, Sk Subidh, Sinanoglu, Ozgur

Year:

2015

Language:

english

File:

PDF, 354 KB

english, 2015

8

[IEEE 2015 33rd IEEE International Conference on Computer Design (ICCD) - New York City, NY, USA (2015.10.18-2015.10.21)] 2015 33rd IEEE International Conference on Computer Design (ICCD) - Security implications of cyberphysical digital microfluidic biochips

Ali, Sk Subidh, Ibrahim, Mohamed, Sinanoglu, Ozgur, Chakrabarty, Krishnendu, Karri, Ramesh

Year:

2015

Language:

english

File:

PDF, 131 KB

english, 2015

9

A Comprehensive Design-for-Test Infrastructure In the Context of Security-Critical Applications

Saeed, Samah, Sinanoglu, Ozgur

Journal:

IEEE Design and Test

Year:

2016

Language:

english

File:

PDF, 207 KB

english, 2016

10

[IEEE 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Lisbon, Portugal (2015.5.24-2015.5.27)] 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - A secure design-for-test infrastructure for lifetime security of SoCs

Backer, Jerry, Ali, Sk Subidh, Rosenfeld, Kurt, Hely, David, Sinanoglu, Ozgur, Karri, Ramesh

Year:

2015

Language:

english

File:

PDF, 558 KB

english, 2015

11

Building Trustworthy Systems Using Untrusted Components: A High-Level Synthesis Approach

Rajendran, Jeyavijayan, Sinanoglu, Ozgur, Karri, Ramesh

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2016

Language:

english

File:

PDF, 3.17 MB

english, 2016

12

Guest Editorial Special Issue on Secure and Trustworthy Computing

Sinanoglu, Ozgur, Karri, Ramesh

Journal:

ACM Journal on Emerging Technologies in Computing Systems

Year:

2016

Language:

english

File:

PDF, 42 KB

english, 2016

13

Supply-Chain Security of Digital Microfluidic Biochips

Ali, Sk Subidh, Ibrahim, Mohamed, Rajendran, Jeyavijayan, Sinanoglu, Ozgur, Chakrabarty, Krishnendu

Journal:

Year:

2016

Language:

english

File:

PDF, 2.83 MB

english, 2016

14

[IEEE 2016 IEEE Biomedical Circuits and Systems Conference (BioCAS) - Shanghai, China (2016.10.17-2016.10.19)] 2016 IEEE Biomedical Circuits and Systems Conference (BioCAS) - Microfluidic encryption of on-chip biochemical assays

Ali, Sk Subidh, Ibrahim, Mohamed, Sinanoglu, Ozgur, Chakrabarty, Krishnendu, Karri, Ramesh

Year:

2016

Language:

english

File:

PDF, 1.03 MB

english, 2016

15

[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Towards provably-secure performance locking

Zaman, Monir, Sengupta, Abhrajit, Liu, Danqing, Sinanoglu, Ozgur, Makris, Yiorgos, Rajendran, Jeyavijayan J V

Year:

2018

Language:

english

File:

PDF, 15.89 MB

english, 2018

16

[IEEE 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) - Jeju (2018.1.22-2018.1.25)] 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) - Concerted wire lifting: Enabling secure and cost-effective split manufacturing

Patnaik, Satwik, Knechtel, Johann, Ashraf, Mohammed, Sinanoglu, Ozgur

Year:

2018

Language:

english

File:

PDF, 426 KB

english, 2018

17

[ACM Press the 55th Annual Design Automation Conference - San Francisco, California (2018.06.24-2018.06.29)] Proceedings of the 55th Annual Design Automation Conference on - DAC '18 - Raise your game for split manufacturing

Patnaik, Satwik, Ashraf, Mohammed, Knechtel, Johann, Sinanoglu, Ozgur

Year:

2018

Language:

english

File:

PDF, 870 KB

english, 2018

18

[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Towards Provably Secure Logic Locking for Hardening Hardware Security Dissertation Summary: IEEE TTTC E.J. McCluskey Doctoral Thesis Award Competition

Yasin, Muhammad, Sinanoglu, Ozgur

Year:

2018

File:

PDF, 10 KB

2018

19

Spin-Orbit Torque Devices for Hardware Security: From Deterministic to Probabilistic Regime

Patnaik, Satwik, Rangarajan, Nikhil, Knechtel, Johann, Sinanoglu, Ozgur, Rakheja, Shaloo

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2019

Language:

english

File:

PDF, 3.97 MB

english, 2019

20

[IEEE 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Lausanne, Switzerland (2019.7.15-2019.7.18)] 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) - Mixed-Signal Hardware Security Using MixLock: Demonstration in an Audio Application

Leonhard, Julian, Louerat, Marie-Minerve, Aboushady, Hassan, Sinanoglu, Ozgur, Stratigopoulos, Haralampos-G.

Year:

2019

Language:

english

File:

PDF, 900 KB

english, 2019

21

[IEEE 2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Westminster, CO, USA (2019.11.4-2019.11.7)] 2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Is Robust Design-for-Security Robust Enough? Attack on Locked Circuits with Restricted Scan Chain Access

Limaye, Nimisha, Sengupta, Abhrajit, Nabeel, Mohammed, Sinanoglu, Ozgur

Year:

2019

File:

PDF, 2.97 MB

2019

22

Obfuscating the Interconnects: Low-Cost and Resilient Full-Chip Layout Camouflaging

Patnaik, Satwik, Ashraf, Mohammed, Sinanoglu, Ozgur, Knechtel, Johann

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2020

Language:

english

File:

PDF, 3.14 MB

english, 2020

23

Opening the Doors to Dynamic Camouflaging: Harnessing the Power of Polymorphic Devices

Rangarajan, Nikhil, Patnaik, Satwik, Knechtel, Johann, Karri, Ramesh, Sinanoglu, Ozgur, Rakheja, Shaloo

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2020

File:

PDF, 3.39 MB

2020

24

Power Side-Channel Attacks in Negative Capacitance Transistor (NCFET)

Knechtel, Johann, Patnaik, Satwik, Nabeel, Mohammed, Ashraf, Mohammed, Chauhan, Yogesh S., Henkel, Jorg, Sinanoglu, Ozgur, Amrouch, Hussam

Journal:

Year:

2020

File:

PDF, 1007 KB

2020

25

2.5D Root of Trust: Secure System-Level Integration of Untrusted Chiplets

Nabeel, Mohammed, Ashraf, Mohammed, Patnaik, Satwik, Soteriou, Vassos, Sinanoglu, Ozgur, Knechtel, Johann

Journal:

IEEE Transactions on Computers

Year:

2020

File:

PDF, 3.73 MB

2020

26

Thwarting All Logic Locking Attacks: Dishonest Oracle with Truly Random Logic Locking

Limaye, Nimisha, Kalligeros, Emmanouil, Karousos, Nikolaos, Karybali, Irene G., Sinanoglu, Ozgur

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2020

File:

PDF, 2.00 MB

2020

27

Fast and energy-frugal deterministic test through efficient compression and compaction techniques

Ozgur Sinanoglu, Alex Orailoglu

Journal:

Journal of Systems Architecture

Year:

2004

Language:

english

File:

PDF, 298 KB

english, 2004

28

Scan-in and Scan-out Transition Co-optimization Through Modelling Generalized Serial Transformations

Ozgur Sinanoglu

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 386 KB

english, 2008

29

Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan Cells

Ozgur Sinanoglu

Journal:

Journal of Electronic Testing

Year:

2008

Language:

english

File:

PDF, 265 KB

english, 2008

30

On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power

Sobeeh Almukhaizim, Shouq Alsubaihi, Ozgur Sinanoglu

Journal:

Journal of Electronic Testing

Year:

2010

Language:

english

File:

PDF, 393 KB

english, 2010

31

Efficient RT-Level Fault Diagnosis

Ozgur Sinanoglu, Alex Orailoglu

Journal:

Journal of Computer Science and Technology

Year:

2005

File:

PDF, 425 KB

2005

32

Low Cost Scan Test by Test Correlation Utilization

Ozgur Sinanoglu

Journal:

Journal of Computer Science and Technology

Year:

2007

File:

PDF, 507 KB

2007

33

Scan Cell Positioning for Boosting the Compression of Fan-Out Networks

Ozgur Sinanoglu, Mohammed Al-Mulla, Noora A. Shunaiber, Alex Orailoglu

Journal:

Journal of Computer Science and Technology

Year:

2009

Language:

english

File:

PDF, 446 KB

english, 2009

34

Enhancing encoding capacity of combinational test stimulus decompressors

Nader Alawadhi, Ozgur Sinanoglu, Mohammed Al-Mulla

Journal:

SCIENCE CHINA Information Sciences

Year:

2011

Language:

english

File:

PDF, 1.11 MB

english, 2011

35

Predictive Techniques for Projecting Test Data Volume Compression

Saeed, Samah Mohamed, Sinanoglu, Ozgur, Almukhaizim, Sobeeh

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2013

Language:

english

File:

PDF, 250 KB

english, 2013

36

Scan to Nonscan Conversion via Test Cube Analysis

Sinanoglu, Ozgur

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 1.81 MB

english, 2013

37

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - DfT support for launch and capture power reduction in launch-off-capture testing

Saeed, Samah Mohamed, Sinanoglu, Ozgur

Year:

2012

Language:

english

File:

PDF, 293 KB

english, 2012

38

[IEEE 2013 26th International Conference on VLSI Design: concurrently with the 12th International Conference on Embedded Systems - Pune, India (2013.01.5-2013.01.10)] 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems - Sneak-path Testing of Memristor-based Memories

Kannan, Sachhidh, Rajendran, Jeyavijayan, Karri, Ramesh, Sinanoglu, Ozgur

Year:

2013

Language:

english

File:

PDF, 391 KB

english, 2013

39

Eliminating the Timing Penalty of Scan

Sinanoglu, Ozgur, Agrawal, Vishwani D.

Journal:

Journal of Electronic Testing

Year:

2013

Language:

english

File:

PDF, 459 KB

english, 2013

40

Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints

Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu

Journal:

Journal of Electronic Testing

Year:

2013

Language:

english

File:

PDF, 657 KB

english, 2013

41

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Adaptive testing: Conquering process variations

Yilmaz, Ender, Ozev, Sule, Sinanoglu, Ozgur, Maxwell, Peter

Year:

2012

Language:

english

File:

PDF, 1.13 MB

english, 2012

42

Expedited-compact architecture for average scan power reduction

Saeed, Samah Mohamed Ahmed, Sinanoglu, Ozgur

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 626 KB

english, 2013

43

Design for Testability Support for Launch and Capture Power Reduction in Launch-Off-Shift and Launch-Off-Capture Testing

Saeed, Samah Mohamed, Sinanoglu, Ozgur

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2014

Language:

english

File:

PDF, 265 KB

english, 2014

44

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Detection, diagnosis, and repair of faults in memristor-based memories

Kannan, Sachhidh, Karimi, Naghmeh, Karri, Ramesh, Sinanoglu, Ozgur

Year:

2014

Language:

english

File:

PDF, 962 KB

english, 2014

45

[IEEE 2013 IEEE 31st International Conference on Computer Design (ICCD) - Asheville, NC, USA (2013.10.6-2013.10.9)] 2013 IEEE 31st International Conference on Computer Design (ICCD) - Sneak path testing and fault modeling for multilevel memristor-based memories

Kannan, Sachhidh, Karri, Ramesh, Sinanoglu, Ozgur

Year:

2013

File:

PDF, 674 KB

2013

46

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Expedited response compaction for scan power reduction

Saeed, Samah Mohamed, Sinanoglu, Ozgur

Year:

2011

Language:

english

File:

PDF, 623 KB

english, 2011

47

[IEEE 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - Arlington, VA, USA (2014.5.6-2014.5.7)] 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - New scan attacks against state-of-the-art countermeasures and DFT

Ali, Sk Subidh, Sinanoglu, Ozgur, Saeed, Samah Mohamed, Karri, Ramesh

Year:

2014

Language:

english

File:

PDF, 178 KB

english, 2014

48

Regaining Trust in VLSI Design: Design-for-Trust Techniques

Rajendran, Jeyavijayan, Sinanoglu, Ozgur, Karri, Ramesh

Journal:

Proceedings of the IEEE

Year:

2014

Language:

english

File:

PDF, 3.07 MB

english, 2014

49

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - High-level synthesis for security and trust

Rajendran, Jeyavijayan, Huan Zhang,, Sinanoglu, Ozgur, Karri, Ramesh

Year:

2013

Language:

english

File:

PDF, 122 KB

english, 2013

50

[IEEE 2011 12th Latin American Test Workshop - LATW - Beach of Porto de Galinhas, Brazil (2011.03.27-2011.03.30)] 2011 12th Latin American Test Workshop (LATW) - Error-resilient design of branch predictors for effective yield improvement

Almukhaizim, Sobeeh, Sinanoglu, Ozgur

Year:

2011

Language:

english

File:

PDF, 153 KB

english, 2011